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A seminar at the Faculty of Pharmacy, University of Kufa about Atomic force microscopy (AFM)

In the Pharmaceutics and Pharmaceutical Industry department. A seminar was hold on Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), by A.ProfessorDr. Sarmad Sabah Al Edressy.

Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometre, more than 1000 times better than the optical diffraction limit. The information is gathered by “feeling” or “touching” the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the nuclear force.

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